Practice Follow Design-for-test (dft) Strategies (4.7.2) - Design Principles for Analog and Digital Integration

Practice: Follow design-for-test (DFT) strategies

Lesson 4.7.2Design Principles for Analog and Digital Integration

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10 questions

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6 sample questions

Question 1.
What does DFT stand for?
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Think about testing techniques.
Question 2.
Name one benefit of scan chains.
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Consider how you can see inside a circuit.
3Question 3.
What is the primary goal of DFT strategies?
- To improve manufacturing speed
- To facilitate testing of ICs
- To lower production cost
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Think about why we focus on testing in design.
4Question 4.
True or False: Scan chains are only used in digital logic.
- True
- False
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Consider the nature of what scan chains interact with.
Question 5.
Critically evaluate how the implementation of DFT strategies could affect the design process of a mixed-signal system. Consider aspects such as complexity, cost, and reliability.
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Think about the trade-offs between upfront costs and long-term benefits.
Question 6.
Design a test strategy for a mixed-signal system that includes both digital processing and analog signal inputs. What elements of DFT would you include and why?
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Consider each component's role in verifying performance.

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