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3 cards from this section. Quick, good the night before a test.
What is a scan chain?
Think about how flip-flops can be arranged.
What do we call the process of shifting data into a scan chain?
Consider the direction of the data flow.
What does 'scan-in' refer to in the context of scan chains?
It's what you do when you want to push data into the scan.
True or False: Scan chains can only be used for detecting stuck-at faults.
Consider all the fault types mentioned in the section.
Given a digital circuit with a complex arrangement of components, how would you design a scan chain to optimize testing? Include considerations for fault types.
Think about potential bottlenecks in your design.
Discuss a scenario where the implementation of scan chains might complicate the circuit design. Provide examples of the overhead involved.
Consider how additional components affect circuit complexity.
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