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3 cards from this section. Quick, good the night before a test.
What is a scan chain?
Consider how testability relates to internal states.
What purpose does serial testing serve?
Think about how testing is structured over time.
What is the purpose of scan chains in serial testing?
Consider their primary function in testing.
True or False: Scan chains can help detect stuck-at faults.
Reflect on the types of faults discussed.
Propose a design that integrates scan chains into a digital system while minimizing complexity. Discuss potential trade-offs.
Consider how to simplify while ensuring accessibility.
Evaluate a complex digital system’s ability to use scan chains effectively. Identify potential fault types that might elude detection.
Think about the various complexities in multilevel systems.
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