Practice Limitations Of Scan Chains And Serial Testing (5.5) - Scan Chains and Serial Testing

Practice: Limitations of Scan Chains and Serial Testing

Lesson 5.5Scan Chains and Serial Testing

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9 questions

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3 cards from this section. Quick, good the night before a test.
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6 questions · about 4 min · pass mark 70%. Hints available.
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6 sample questions

Question 1.
What is design overhead?
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Think about what happens when you add more components to any circuit.
Question 2.
Why can't scan chains be used for analog testing?
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Consider the nature of the signals in analog circuits.
3Question 3.
What contributes to the design overhead of scan chains?
- Increased component complexity
- Lower power consumption
- Fewer components
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Think about how adding more parts affects a circuit's complexity.
4Question 4.
Can scan chains be applied to mixed-signal systems?
- True
- False
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Reflect on what makes mixed-signal systems different from purely digital systems.
Question 5.
Propose a methodology to improve the detection of parasitic faults in a complex digital circuit using scan chains.
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Think about how you could layer testing methods.
Question 6.
Design a testing strategy for a mixed-signal system that avoids the limitations of scan chains. Include at least three unique approaches.
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Reflect on how you can adapt your testing tools to the nature of the signals.

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