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3 cards from this section. Quick, good the night before a test.
What is a scan chain?
Think about how we might connect components in a sequence.
What type of faults can serial testing detect?
Consider where signals might not change as expected.
What is the main purpose of a scan chain?
Think about what makes testing easier.
Serial testing can only detect which type of faults?
Recall the different faults mentioned.
Analyze a digital circuit design that uses scan chains. Identify potential downsides of its use and suggest improvements.
Consider what you know about design overhead.
Propose a serial testing strategy for a complex SoC. Explain how you would ensure thorough fault detection.
Think about what makes fault detection comprehensive.
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