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2 cards from this section. Quick, good the night before a test.
What is a scan chain?
Think about how flip-flops are connected.
What does scan mode replace in a circuit?
Consider what testing replaces in a circuit.
What happens during the test phase regarding data?
Think about what the scan chain allows during testing.
True or False: The scan chain can help detect stuck-at faults.
Recall what types of faults are indicated by test patterns.
Design a small digital circuit that utilizes a scan chain. Explain how you would implement test vectors and what faults you would expect to catch.
Think about how each part of the circuit interacts with the test patterns.
Consider a scenario where a scan chain fails to detect certain delayed signals in high-speed applications. How might you enhance fault coverage in this situation?
Reflect on the limitations of scan chains in complex systems and consider supplementary strategies.
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