Practice Fault Coverage With Scan Chains (5.3.2) - Scan Chains and Serial Testing

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10 questions

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6 sample questions

Question 1.
What is a stuck-at fault?
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Think about how circuits behave normally.
Question 2.
How do scan chains help detect faults?
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Consider both observability and controllability.
3Question 3.
What type of fault occurs when a node is stuck at a logical high or low?
- Delay Fault
- Stuck-At Fault
- Bridging Fault
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Remember the definition of stuck-at faults.
4Question 4.
True or False: Scan chains can completely eliminate all types of faults.
- True
- False
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Consider the limitations discussed.
Question 5.
Design a circuit that could potentially include stuck-at faults and outline a testing strategy using scan chains.
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Think about handling each node in your test design.
Question 6.
Consider a complex IC that implemented scan chains. Discuss the potential consequences if delay faults are overlooked during testing.
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Reflect on what timing inconsistencies could lead to in synchronous systems.

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