Practice Conclusion (5.6) - Scan Chains and Serial Testing - Design for Testability

Practice: Conclusion

Lesson 5.6Scan Chains and Serial Testing

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10 questions

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6 sample questions

Question 1.
What is a scan chain?
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Look for its relation to testing procedures.
Question 2.
Name one benefit of using scan chains.
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Consider how they affect testing processes.
3Question 3.
What do scan chains primarily provide in digital circuit testing?
- Simplified design
- Access to internal states
- Increased cost
- Analog testing
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Consider what access means in relation to testing and internal structure.
4Question 4.
Scan chains significantly improve fault coverage.
- True
- False
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Think about what higher coverage indicates in a testing environment.
Question 5.
Evaluate how the implementation of scan chains could affect the production design cycle in modern electronics. What factors should engineers consider in this evaluation?
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Consider both the immediate gains and long-term implications on design processes.
Question 6.
Propose an alternative testing strategy that can complement scan chain usage in digital circuits. Justify your choice.
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Think about how self-testing can reduce reliance on external testing methods.

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