Practice Structural Dft Methods (1.5.2) - Introduction to Design for Testability

Practice: Structural DFT Methods

Lesson 1.5.2Introduction to Design for Testability

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9 questions

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2 cards from this section. Quick, good the night before a test.
Exercise
6 questions · about 4 min · pass mark 70%. Hints available.
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6 sample questions

Question 1.
What is a scan chain designed for?
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Think about how data might move in a chain.
Question 2.
What does BIST stand for?
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It's a method to allow systems to test themselves.
3Question 3.
What is the primary purpose of Structural DFT methods?
- To increase the complexity of designs
- To facilitate easier testing of electronic systems
- To reduce manufacturing costs
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Consider what makes a system easier to verify.
4Question 4.
True or False: Built-In Self-Test (BIST) requires external testing equipment.
- True
- False
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Think about the term 'self-test'.
Question 5.
Given a complex digital circuit with high integration, assess how implementing scan chain design might impact the testing speed and fault coverage.
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Reflect on the systematic process of testing multiple components through one strategy.
Question 6.
Evaluate the trade-offs between utilizing BIST and relying solely on manual testing in a manufacturing environment. Which would you prefer and why?
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Consider the costs and benefits on both sides when weighing your decision.

5 more questions in this section. Enroll free to practise them all.