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5 cards from this section. Quick, good the night before a test.
What are Test Access Points (TAPs)?
Think about how engineers access signals.
Describe Built-In Self-Test (BIST) in your own words.
How does it simplify the testing process?
What do Test Access Points (TAPs) provide?
Consider what TAPs are designed to do.
True or False: Built-In Self-Test (BIST) requires external testing equipment.
Think about the definition of BIST.
Design a circuit and identify where you would incorporate Test Access Points. Justify your choices based on potential fault detection scenarios.
Think about the most common points of failure in electronic designs.
Critique a hypothetical electronic system lacking observability and controllability features. What problems might engineers face in testing?
Consider how critical insights into internal processes are for troubleshooting.
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