Practice Scan Chain Configuration (6.2.2) - Implementation and Optimization of Scan Chains for Improved Testability

Practice: Scan Chain Configuration

Lesson 6.2.2Implementation and Optimization of Scan Chains for Improved Testability

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9 questions

Flashcard drill
2 cards from this section. Quick, good the night before a test.
Exercise
6 questions · about 4 min · pass mark 70%. Hints available.
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Quiz
3 questions · about 2 min · pass mark 70%. Hints available.
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6 sample questions

Question 1.
What is meant by chain length in scan chains?
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Consider how this relates to testing duration.
Question 2.
Why would you use multiple scan chains?
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Think about time efficiency during testing.
3Question 3.
What impact does chain length have in scan chains?
- Increases test time
- Reduces power consumption
- Enhances fault coverage
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Think about how data travels in a chain.
4Question 4.
True or False: Using multiple scan chains can reduce testing time.
- True
- False
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Consider how parallel processes work in testing.
Question 5.
Design a scenario with an electronic system using scan chains. Optimize the scan chain configuration considering speed and fault coverage.
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List possible components and how they can be grouped.
Question 6.
Evaluate the effect of increasing the number of flip-flops in a single chain. Discuss any potential outcomes regarding test time and fault detection.
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Consider both side effects and direct impacts on test processes.

5 more questions in this section. Enroll free to practise them all.