Practice Power Consumption During Testing (6.3.2) - Implementation and Optimization of Scan Chains for Improved Testability

Practice: Power Consumption During Testing

Lesson 6.3.2Implementation and Optimization of Scan Chains for Improved Testability

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10 questions

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3 cards from this section. Quick, good the night before a test.
Exercise
6 questions · about 4 min · pass mark 70%. Hints available.
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Quiz
4 questions · about 3 min · pass mark 70%. Hints available.
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6 sample questions

Question 1.
What is power gating?
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Think about power management strategies.
Question 2.
Name one technique to minimize power consumption during testing.
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Focus on data shifting activities.
3Question 3.
What is the primary concern with power consumption during testing in scan chains?
- Increased testing time
- Reduced device performance
- High energy usage
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Consider impacts on battery-operated devices.
4Question 4.
True or False: Test pattern compression can help reduce power consumption during testing.
- True
- False
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Reflect on how data processing affects energy consumption.
Question 5.
Design a theoretical system with a scan chain that reduces power consumption using both test pattern compression and power gating. Describe how each technique contributes to efficiency.
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Focus on how the combined actions of these techniques lead to energy savings.
Question 6.
Analyze the potential impacts of excessive power consumption during testing on the overall design lifecycle of a mobile device.
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Consider the lifecycle from design to consumer use.

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