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3 cards from this section. Quick, good the night before a test.
What is the primary role of scan chains in digital circuit testing?
Think about how we access internal circuit states.
Name one possible challenge faced when implementing scan chains.
Consider the effects of changes on the overall system.
What is the primary function of scan chains?
Consider how they help in identifying issues within circuits.
True or False: Scan chains reduce the overall design complexity.
Think about new components and their effects.
Design a scenario where multiple scan chains can optimize the testing process in a complex SoC. Discuss the advantages and potential drawbacks.
What happens if you try to test all sections at once?
Evaluate the effectiveness of advanced fault models in conjunction with scan chains for detecting faults in high-speed circuits.
Why might conventional models fall short?
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