Practice Improving Fault Coverage (6.4.3) - Implementation and Optimization of Scan Chains for Improved Testability

Practice: Improving Fault Coverage

Lesson 6.4.3Implementation and Optimization of Scan Chains for Improved Testability

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10 questions

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3 cards from this section. Quick, good the night before a test.
Exercise
6 questions · about 4 min · pass mark 70%. Hints available.
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Quiz
4 questions · about 3 min · pass mark 70%. Hints available.
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6 sample questions

Question 1.
What is a redundant flip-flop?
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Think about backup systems.
Question 2.
What type of fault occurs when a flip-flop fails to change state?
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Focus on state changes.
3Question 3.
What are redundant flip-flops used for?
- To reduce circuit area
- To improve fault observability
- To speed up transitions
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Think of their role in visibility and fault detection.
4Question 4.
True or False: Delay faults are always visible during normal operation.
- True
- False
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Consider how testing approaches might differ from normal operations.
Question 5.
Consider a digital circuit designed with just enough flip-flops for regular operation. Discuss how adding redundant flip-flops might improve test strategy despite increased area.
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Think about the impact of observability.
Question 6.
Create a testing strategy that utilizes advanced fault models for a hypothetical high-speed circuit. Outline potential pitfalls and how to overcome them.
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Focus on the unique challenges high-speed circuits face.

6 more questions in this section. Enroll free to practise them all.