Practice Implementation And Optimization Of Scan Chains For Improved Testability (6)

Practice: Implementation and Optimization of Scan Chains for Improved Testability

Lesson 6Implementation and Optimization of Scan Chains for Improved Testability

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10 questions

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4 questions · about 3 min · pass mark 70%. Hints available.
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6 sample questions

Question 1.
What is a scan chain?
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Think about how flip-flops are connected.
Question 2.
Name one component of a scan chain.
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Which parts help manage data in and out of the chain?
3Question 3.
What is the primary purpose of scan chains in digital circuits?
- A) Reduce area
- B) Enhance testability
- C) Increase performance
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Think about what role they play during the testing phase.
4Question 4.
True or False: Scan chains can increase power consumption during testing due to data shifting activities.
- True
- False
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Consider the activities involved when testing with scan chains.
Question 5.
Design a hypothetical scan chain for a simple 4-bit counter and explain how you would test it.
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Draw the circuit and label the components.
Question 6.
Suppose adding a new functionality increases the number of flip-flops. How would you mitigate the effects on power and performance?
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Think about strategies discussed in optimization techniques.

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