Practice Fault Coverage And Redundancy (6.3.3) - Implementation and Optimization of Scan Chains for Improved Testability

Practice: Fault Coverage and Redundancy

Lesson 6.3.3Implementation and Optimization of Scan Chains for Improved Testability

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9 questions

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2 cards from this section. Quick, good the night before a test.
Exercise
6 questions · about 4 min · pass mark 70%. Hints available.
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Quiz
3 questions · about 2 min · pass mark 70%. Hints available.
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6 sample questions

Question 1.
What is fault coverage?
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Think about why we bother testing circuits in the first place.
Question 2.
How does redundancy help in testing?
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What happens when you have more eyes looking out for problems?
3Question 3.
What is the primary goal of redundancy in scan chains?
- To increase circuit complexity
- To enhance fault detection
- To decrease testing time
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Think about why you'd want more components in a testing scenario.
4Question 4.
True or False: Fault coverage can be achieved without redundancy.
- True
- False
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Consider the relationship between redundancy and coverage.
Question 5.
Design a basic circuit testing strategy that incorporates redundancy and explains its benefits.
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Think about how each component interacts.
Question 6.
Evaluate a given scan chain design for its fault coverage and identify areas where redundancy could be enhanced.
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Focus on both hard-to-detect faults and critical circuit areas.

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