Practice Basic Structure Of Scan Chains (6.2.1) - Implementation and Optimization of Scan Chains for Improved Testability

Practice: Basic Structure of Scan Chains

Lesson 6.2.1Implementation and Optimization of Scan Chains for Improved Testability

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9 questions

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4 cards from this section. Quick, good the night before a test.
Exercise
6 questions · about 4 min · pass mark 70%. Hints available.
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Quiz
3 questions · about 2 min · pass mark 70%. Hints available.
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6 sample questions

Question 1.
What is the purpose of Scan-In in a scan chain?
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Think about where data enters during testing.
Question 2.
Name one of the components of a scan chain.
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Consider the building blocks we discussed.
3Question 3.
What is the purpose of Scan-In?
- To output test results
- To enable normal operation
- To input test vectors
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Think about what data you put into the system.
4Question 4.
True or False: The Scan Enable signal is used to switch between normal and test modes.
- True
- False
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Consider how you toggle operations.
Question 5.
Design a simple scan chain consisting of four flip-flops. Explain how you would connect the Scan-In and Scan-Out, and describe the role of the Scan Enable signal.
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Think about the flow of data through the flip-flops.
Question 6.
Explain the potential drawbacks of having a very long scan chain in terms of power consumption and testing efficiency.
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Consider both operational and design perspectives.

5 more questions in this section. Enroll free to practise them all.