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3 cards from this section. Quick, good the night before a test.
What does ATE stand for?
Think about what automates testing.
What is a stuck-at fault?
Consider its name—what does 'stuck' imply?
What does ATE primarily do?
Remember its primary function in testing systems.
True or False: The stuck-at fault model is a method used to automate testing.
Consider the difference between fault diagnosis and testing automation.
Design a basic fault model for a simple digital circuit with multiple logic gates. Describe its advantages.
Consider different types of faults and how they might manifest in a circuit.
Critically analyze the shift to ATE in the context of increasing complexity in IC design. What potential challenges could arise?
Think about both the benefits and the logistical considerations involved.
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