Practice Introduction To Fault Models, Testing Methodologies, And Industry Standards (3.1)

Practice: Introduction to Fault Models, Testing Methodologies, and Industry Standards

Lesson 3.1Fault Models, Testing Methodologies, and Industry Standards

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9 questions

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2 cards from this section. Quick, good the night before a test.
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6 questions · about 4 min · pass mark 70%. Hints available.
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6 sample questions

Question 1.
Define what a fault model is.
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Think about how failures are categorized in circuits.
Question 2.
What does a stuck-at fault represent?
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Consider what happens when a circuit can't change its output.
3Question 3.
What is a stuck-at fault?
- A fault where a signal is constantly high
- A fault that allows signal transition
- A fault in analog circuits
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Think about what stuck-at means.
4Question 4.
Is functional testing sufficient to identify all faults?
- True
- False
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Consider what is not covered by functional tests.
Question 5.
Consider a circuit with multiple pathways. If one pathway is subject to a stuck-at fault, how could that affect the overall circuit functionality?
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Think about how a stuck line impacts signal flow.
Question 6.
Describe a scenario in which using BIST might be more beneficial than traditional testing methods.
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Consider accessibility and the need for independence from external equipment.

5 more questions in this section. Enroll free to practise them all.