Practice Scan-based Testing (8.2.1) - Design for Testability Strategies

Practice: Scan-Based Testing

Lesson 8.2.1Design for Testability Strategies

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10 questions

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6 sample questions

Question 1.
What is a scan chain?
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Think about how signals travel through circuits!
Question 2.
Name one type of fault that scan-based testing can detect.
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Consider how a signal might behave incorrectly.
3Question 3.
What does scan-based testing primarily aim to improve?
- Cost Reduction
- Fault Coverage
- Performance
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Think about what testing focuses on enhancing.
4Question 4.
True or False: Scan mode provides access to internal state without the need for physical access.
- True
- False
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Reflect on the difference scan mode makes.
Question 5.
Consider a complex digital system where scan-based testing has been implemented. Discuss how you would design the scan chain to ensure the maximum fault coverage and minimal overhead.
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Think about how to integrate testability features with minimal disruption.
Question 6.
How would you address the power consumption challenges associated with scan-based testing while maintaining effective fault coverage?
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Reflect on ways to reduce power during test phases.

6 more questions in this section. Enroll free to practise them all.