Practice Common Design For Testability (dft) Techniques (8.2) - Design for Testability Strategies

Practice: Common Design for Testability (DFT) Techniques

Lesson 8.2Design for Testability Strategies

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9 questions

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4 cards from this section. Quick, good the night before a test.
Exercise
6 questions · about 4 min · pass mark 70%. Hints available.
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Quiz
3 questions · about 2 min · pass mark 70%. Hints available.
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6 sample questions

Question 1.
What does DFT stand for?
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Think about what it means to design systems that are easier to test.
Question 2.
Name one advantage of Built-In Self-Test.
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Consider scenarios where external equipment might not be available.
3Question 3.
What is a primary purpose of Scan-Based Testing?
- To increase manufacturing speed
- To enable easier testing of internal signals
- To reduce physical size
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Consider what 'scan' refers to in a testing context.
4Question 4.
BIST allows systems to test themselves. True or False?
- True
- False
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Think about scenarios where external testing might not be possible.
Question 5.
Discuss the trade-offs of implementing BIST in a critical embedded system environment. Consider aspects such as overhead, testing accuracy, and real-time applications.
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Focus on the balance between benefits and potential drawbacks in real-time settings.
Question 6.
Design a scenario where Scan-Based Testing outperforms traditional debugging methods. Enumerate the advantages in detail.
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Think about efficiency and time savings in fast-paced production environments.

5 more questions in this section. Enroll free to practise them all.