Practice Limitations Of Bist In Electronic Circuit Testing (4.5) - Built-in Self-Test (BIST) Techniques

Practice: Limitations of BIST in Electronic Circuit Testing

Lesson 4.5Built-in Self-Test (BIST) Techniques

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9 questions

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4 cards from this section. Quick, good the night before a test.
Exercise
6 questions · about 4 min · pass mark 70%. Hints available.
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Quiz
3 questions · about 2 min · pass mark 70%. Hints available.
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6 sample questions

Question 1.
What is one disadvantage of increased design complexity with BIST?
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Think about added components and their implications.
Question 2.
What type of faults do BIST techniques primarily struggle to detect?
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Consider the limitations of predefined test patterns.
3Question 3.
What is one disadvantage of using BIST?
- It reduces system reliability
- It increases design complexity
- It is costlier than external testing
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Look for the option that indicates a challenge in the design phase.
4Question 4.
Does BIST improve fault coverage for complex faults?
- True
- False
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Remember the limitations specified in this aspect.
Question 5.
Propose a redesign of a digital circuit that includes BIST but minimizes the design complexity. What strategies might you use?
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Think about how modularization in circuit design can simplify integration.
Question 6.
Consider a safety-critical embedded system using BIST. Describe how you would address the limitations of fault coverage and unknown fault detection.
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Imagine what strategies can enhance reliability and fault detection in critical systems.

5 more questions in this section. Enroll free to practise them all.