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4 cards from this section. Quick, good the night before a test.
Define fault coverage.
Think about what measuring the ability to catch faults means.
What are stuck-at faults?
Consider the behavior of signals in a circuit.
What is fault coverage?
Think about what quality standards are in measures of testing.
Stuck-at faults can lead to circuit failures. True or False?
Consider the implications of a signal being unable to change.
Design a BIST system that maximizes detection efficiency for both stuck-at and transition faults. What tests would you include?
Think about how incorporating multiple patterns enhances fault coverage.
Analyze a real-world scenario where delay faults could critically impact a system’s functionality. How would BIST mitigate these risks?
Consider the role of timing specifications in high-speed designs.
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